TY  - BOOK
ED  - International conference on defects in semiconductors
TI  - 25th International conference on defects in semiconductors, St. Petersburg, Russia, July 20-24, 2009
SN  - 978-5-93634-048-2
PY  - 2009///
CY  - St Petersburg
PB  - Ioffe inst.
KW  - Полупроводники
KW  - Съезды, совещания и т.п
KW  - Дефекты
KW  - RU\NLR\AUTH\661261436
KW  - В379.2я431(0)
KW  - З843.304я431(0)
N2  - Библиогр. в конце тез; Указ.: с. 451-466
ER  -