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_aSemiconductor devices measurements and tests _fG. Grin _gTransl. from the Russ. by Alexander Repyev |
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| 300 | _aДоп. тит. л. на рус. яз.: Измерение параметров и испытание полупроводниковых приборов / Г. И. Грин | ||
| 320 | _aБиблиогр.: с. 208 | ||
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